首页 | 本学科首页   官方微博 | 高级检索  
     


On the road to high-resolution 3D molecular imaging
Authors:Arnaud Delcorte
Affiliation:PCPM Laboratory, Université Catholique de Louvain, Louvain-la-Neuve, Belgium
Abstract:This contribution reviews the state-of-the-art in the domains of molecular imaging and depth profiling, the two methodological platforms required for 3D molecular imaging by secondary ion mass spectrometric (SIMS). Using molecular dynamics calculations, it also describes some of the mechanisms that make cluster projectiles such as C60 so different for organic sample analysis. The discussion addresses issues that deserve proper attention on the way to 3D molecular imaging in SIMS, such as ultimate lateral resolution, limited molecular yields, chemical effects and damage, and highlights solutions currently in embryo in the many research teams concerned by 3D molecular imaging.
Keywords:ToF-SIMS   SIMS imaging   Depth-profiling   Molecular ion   Chemical analysis   Surface characterization   Nanotechnology   Cell   Organics   Polymers
本文献已被 ScienceDirect 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号