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XPS study of laser fabricated titanium/KaptonFN interfaces |
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| Authors: | Grigor L Georgiev Taslema Sultana Ronald J Baird Golam Newaz Rahul Patwa |
| Institution: | a Department of Chemical Engineering and Materials Science, Wayne State University, 5050 Anthony Wayne Dr., Detroit, MI 48202, USA b Smart Sensors and Integrated Microsystems, Wayne State University, 5050 Anthony Wayne Dr., Detroit, MI 48202, USA c Institute for Manufacturing Research, Wayne State University, 666 Hancock Ave., Detroit, MI 48202, USA d Fraunhofer Center for Laser Technology, 46025 Port St., Plymouth, MI 48170, USA |
| Abstract: | KaptonFN film consists of a polyimide core that has been laminated with FEP fluoropolymer outer layers. This composite material's resistance to most chemical solvents, heat sealability and low moisture uptake make KaptonFN attractive as a packaging material for electronics and implantable devices. KaptonFN/Ti micro-joints were fabricated by using focused infrared laser irradiation. The micro-joints were mechanically debonded, and the KaptonFN/Ti interfaces were studied by using X-ray photoelectron spectroscopy (XPS). The locus of failure of the joints was found to be in the FEP layer near the interface with the Ti. The XPS results give evidence for the formation of Ti F bond in the interfacial region. |
| Keywords: | KaptonFN/Ti interfaces Laser fabrication XPS |
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