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Emission of positronium in a nanometric PMMA film |
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| Authors: | CA Palacio J De Baerdemaeker C Dauwe |
| Institution: | a Department of Subatomic and Radiation Physics, Ghent University, Proeftuinstraat 86, B-9000 Ghent, Belgium b Institute of Physics, University of Antioquia, A.A. 1226 Medellin, Colombia c Ghent University, Department of Information Technology, St. Pietersniewstraat 41, B-9000 Ghent, Belgium |
| Abstract: | Positron beam experiments have been performed for the first time on a self-supporting polymethyl metacrylate (PMMA) film of 310 nm-thick made by spin coating. The positronium (Ps) emission from the PMMA surface is studied as a function of the positron implantation energy by using Doppler profile spectroscopy and Compton-to-peak ratio analysis. When the sample and the Ge-detector are perpendicular to the positron beam, the emission of para-positronium (p-Ps) is detected as a narrow central peak. By rotating the sample 45° with respect to the beam, the emission of p-Ps is detected as a blue-shifted fly-away peak. The bulk Ps fraction, the efficiency for the emission of Ps by picking up an electron from the surface, and the diffusion lengths of positrons (thermal and or epithermal), p-Ps and ortho-positronium (o-Ps) are obtained. |
| Keywords: | 41 75 Fr 34 80 Uv 82 35 Lr 78 70 Bj 71 60 +z 36 10 Dr |
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