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X-ray photoelectron and X-ray Auger electron spectroscopy studies of heavy ion irradiated C60 films |
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| Authors: | Amit Kumar F. Singh S.M. Shivaprasad J.C. Pivin |
| Affiliation: | a Institut NEEL, CNRS and Université Joseph Fourier, 25 rue des Martyrs, BP166, 38042 Grenoble Cedex 9, France b Materials Science Division, Inter-University Accelerator Centre, Post Box 10502, New Delhi 110067, India c Surface Physics and Nanostructures Group, National Physical Laboratory, New Delhi 110060, India d Centre Spectrometrie Nucleaire et de Spectrometrie de Masse (CSNSM)-(IN2P3), Bâtiment 108, 91405 Orsay Campus, France |
| Abstract: | The influence of 200 MeV Au ion irradiation on the surface properties of polycrystalline fullerene films has been investigated. The X-ray photoelectron and X-ray Auger electron spectroscopies are employed to study the ion-induced modification of the fullerene, near the surface region. The shift of C 1s core level and decrease in intensity of shake-up satellite were used to investigate the structural changes (like sp2 to sp3 conversion) and reduction of π electrons, respectively, under heavy ion irradiation. Further, X-ray Auger electron spectroscopy was employed to investigate hybridization conversion qualitatively as a function of ion fluence. |
| Keywords: | Ion irradiation Fullerene X-ray photoelectron spectroscopy X-ray-induced Auger electron spectroscopy |
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