首页 | 本学科首页   官方微博 | 高级检索  
     


Quantitative analysis of mixed self-assembled monolayers using ToF-SIMS
Authors:Hyegeun Min  Ganghyuk Jung  Insung S. Choi
Affiliation:a Nanobio Fusion Research Center, Korea Research Institute of Standards and Science, Daejeon 305-600, Republic of Korea
b Department of Nano Surface Science, University of Science and Technology, Daejeon 305-333, Republic of Korea
c Department of Chemistry, Korea Advanced Institute of Science and Technology, Daejeon 305-701, Republic of Korea
Abstract:The spacing of chemical functional groups on self-assembled monolayers (SAMs) plays an important role in controlling the density of biomolecules in biochips and biosensors. In this sense, a mixed SAM made of two different terminal groups is a useful organic surface since spacing can be easily controlled by changing a relative mole fraction in a mixture solution. In this study, an acetylene-OCH2O(EG)3(CH2)11S-S(CH2)11(EG)3OCH2O-propene (Eneyne) SAM and mixed SAMs made by a mixture of (S(CH2)11(EG)3OCH2O-acetylene)2 (Diyne) and (S(CH2)11(EG)3OCH2O-propene)2 (Diene) were produced on gold substrates and measured by using ToF-SIMS. The secondary ion yield ratio of [Au·S(CH2)11(EG)3OCH2O-acetylene] to [Au·S(CH2)11(EG)3OCH2O-propene] was measured for each mixed SAM and plotted as a function of the mole fraction of Diyne to Diene in a SAM solution. The ion yield ratio of a mixed SAM produced from a solution with a mole fraction of 0.5 (i.e., 1:1 mixture) was 0.3, which corresponded well to the ion yield ratio measured from an Eneyne SAM. A time-dependent experiment of Eneyne SAM formation and immersion experiment of Eneyne SAM into Diyne solution or into Diene solution were performed. The relative ion yield ratio of 0.3 was due to a different secondary ion formation and not due to the difference in the amount of adsorbates on the surface, nor to the different binding strengths onto the gold surface. Our study shows that a mixed SAM with well-controlled spacing can be produced and quantified by using the ToF-SIMS technique.
Keywords:Mixed SAM   Quantification   ToF-SIMS   Surface spacing   Disulfide   Biochip
本文献已被 ScienceDirect 等数据库收录!
设为首页 | 免责声明 | 关于勤云 | 加入收藏

Copyright©北京勤云科技发展有限公司  京ICP备09084417号