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Imaging subcellular features of a sectioned rat brain using time-of-flight secondary ion mass spectrometry and scanning probe microscopy |
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| Authors: | H-Y Nie JT Francis MJ Walzak DF MacFabe |
| Institution: | a Surface Science Western, Room G-1, WSC, The University of Western Ontario, London, Ontario N6A 5B7, Canada b The Kilee Patchell-Evans Autism Research Group, Departments of Psychology and Psychiatry, Division of Developmental Disabilities, Shulich School of Medicine and Dentistry, The University of Western Ontario, Room 7252, SSC, London, Ontario N6A 5C2, Canada |
| Abstract: | Coronal sections of unfixed rat brain samples were prepared on a flat substrate in order to reveal hippocampal formation (CA1-4 pyramidal neurons) and adjacent neocortical white matter. We demonstrate the feasibility of using surface sensitive techniques such as time-of-flight secondary ion mass spectrometry (ToF-SIMS) and scanning probe microscopy (SPM) to probe lipid distribution, as well as the subcellular features of neurons. In the same anatomical areas, the phase shift image in SPM is especially useful in revealing the cross-section of subcellular structures. We show that the phase shift images reveal distinctive subcellular features and ion images of CN− and PO2− fragments from ToF-SIMS appear to define some of the subcellular features. |
| Keywords: | Sectioned rat brain Neurons in hippocampus Imaging ToF-SIMS Subcellular ion images Scanning probe microscopy Phase shift image |
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