Nanometer scale characterization of polymer films by atomic-force microscopy |
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| Authors: | Christian Teichert Alfred Haas Gernot M Wallner Reinhold W Lang |
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| Institution: | 1. Institute of Physics, University of Leoben, Franz-Josef-Str. 18, A-8700 Leoben, Austria;2. Institute of Materials Science and Testing of Plastics, University of Leoben, Franz-Josef-Str. 18, A-8700 Leoben, Austria |
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| Abstract: | Atomic-force microscopy was applied to perform a comprehensive surface roughness characterization of commercially available, highly transparent polymer films for transparent insulation applications. The morphological characterization included evaluation of the root-mean-square roughness, the lateral correlation length of roughness as well as the roughness exponent. In addition, high-resolution scans have been recorded yielding morphological information on a length scale of only a few ten nm. These measurements revealed the correlation between surface nanostructure and fabrication technique. For an impact-modified polymethylmethacrylate film with rubber inclusions phase images clearly uncovered the core-shell structure of these inclusions. |
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