Accurate measurement of grain boundary misorientation by Large Angle Convergent Beam Electron Diffraction

A new method using Large Angle Convergent Beam Electron Diffraction (LACBED) patterns is proposed to measure accurately the grain boundary misorientation. The LACBED patterns which are obtained with a defocused convergent electron beam having a convergence semi-angle in the range 1 to 5^o contain very sharp deficiency lines. Due to the good quality of the LACBED patterns, these sharp deficiency lines can be used to measure with great accuracy the grain boundary misorientation. In addition, since the LACBED method is a defocus mode method, the patterns contain at the same time information on the reciprocal space (the deficiency lines typical of the crystal orientation of the two grains on each side of the grain boundary) and on the real space (the image of the grain boundary). We describe a method which allows the identification of the misorientation from these LACBED patterns. The main point to consider is the accuracy which is about 0.05^o. It is much better than the one obtained from other conventional methods used to measure this misorientation.