| Abstract: | Several possibilities for the determination of relative lattice parameter changes and for the absolute measurement of lattice parameters are discussed. Special attention has been given to a measuring device for the high-precision lattice parameter determination according to the BOND method. This device allows to determine the lattice parameters with a relative accuracy of 2 × 10−7. As an example the methods discussed are applied to the investigation of a smoky coloured quartz crystal plate and the results obtained by them were compared. |
