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Investigations of flash evaporated cubIIIC2VI semiconductor thin films by Rutherford backscattering spectroscopy |
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| Authors: | H-J Hbler R Flagmeyer B Schumann |
| Abstract: | The chemical composition of CuBIIIC2VI thin films grown by flash evaporation technique was analysed using Rutherford backscattering spectroscopy. The composition of the samples changes with variation of the substrate temperature. In certain temperature ranges nearly stoichiometric layers were obtained. |
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