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Surface analytical applications of ion-induced secondary emission target currents: I. Oxidation of In and Cu
Affiliation:1. The Eighth Affiliated Hospital, Sun Yat-sen University, Shenzhen 518033, PR China;2. PCMF Lab, School of Chemistry, Sun Yat-sen University, Guangzhou 510006, PR China;1. School of Chemistry and Chemical Engineering, Shihezi University, Shihezi, PR China;2. Chemistry and Chemical Engineering, Central South University, Changsha, PR China;3. State Key Laboratory of Heavy Oil Processing and Department of Chemical Engineering, China University of Petroleum, Beijing, PR China;4. School of Chemical & Biomolecular Engineering and RBI, Georgia Institute of Technology, Atlanta, GA, USA;1. School of Resources and Environmental Engineering, Hefei University of Technology, Hefei 230009, China;2. Key Laboratory of Nanominerals and Pollution Control of Higher Education Institutes, Hefei University of Technology, Hefei 230009, China;3. Anhui Provincial Key Laboratory of Environmental Pollution Control and Waste Recycling, Anhui Jianzhu University, Hefei 230009, China;4. Zhongxin Link Environmental Technology (Anhui) Co. Ltd., Lu’an 237000, China
Abstract:Measurements of ion-induced secondary emission target currents afford a sensitive and rapid means of following the adsorption process. The method has been applied in this instance to monitor O2 uptake by polycrystalline In and Cu substrates.
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