Electrical resistance of epitaxial crystalline films of (SN)x |
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| Authors: | F de la Cruz HJ Stolz |
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| Affiliation: | Max-Planck Institut für Festkörperforschung 7000 Stuttgart 80, Federal Republic of Germany |
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| Abstract: | The electrical resistance of oriented (SN)x-films has been measured from 300 to 0.07 K. The results indicate a finite intrinsic conductivity in the direction perpendicular to the chains, supporting that (SN)x is a strong anisotropic conductor rather than a quasi-one-dimensional system. |
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