Comment on the use of “Kramers-kronig analysis for the determination of the optical constants of thin surface films” by K. Naegele and W.J. Plieth期刊界 All Journals 搜尽天下杂志传播学术成果专业期刊搜索期刊信息化学术搜索

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Comment on the use of “Kramers-kronig analysis for the determination of the optical constants of thin surface films” by K. Naegele and W.J. Plieth

Authors:	Jean Horkans

Institution:	IBM, T.J. Watson Research Center, Yorktown Heights, New York, 10598, USA

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