Model of β-CO on Mo(100): Dissociative adsorption

Secondary ion production during ion bombardment is analyzed experimentally. Secondary ions consist of bulk ions and surface ions. The former originates in the bulk material and the latter in the adsorbed layer. The most probable kinetic energy of bulk ions is higher by several tens of eV than that of surface ions, In order to perform quantitative bulk analysis the surface ions should be removed from the mass spectrum by making use of the difference between these kinetic energies. Secondary ion measurements indicate that the recoil implantation of an adsorbed element occurs to a significant extent under low ion current density bombardment.