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Fractal Roughness Retrieval by Integrated Wavelet Transform |
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| Authors: | Aristide Dogariu Glenn Boreman Jun Uozumi Toshimitsu Asakura |
| Institution: | (1) School of Optics/CREOL, University of Central Florida, Orlando, Florida, 32816, USA;(2) Research Institute for Electronic Science, Hokkaido University, Sapporo, Hokkaido 060-0812, Japan;(3) Faculty of Engineering, Hokkai-Gakuen University, Sapporo, Hokkaido 064-0926, Japan;(4) Transylvania University, Physics Department, Brasov, 2200, Romania;(5) University of Central Florida, Electrical Engineering Department, Orlando, Florida, 32826, USA;(6) Present address: Faculty of Engineering, Hokkai-Gakuen University, Sapporo, Hokkaido 064-0926, Japan |
| Abstract: | An integrated-wavelet-transform (IWT) approach is proposed for the study of scattering from slightly rough surfaces that manifest scaling properties over a finite domain of correlation lengths. Instead of collecting angle-resolved intensities, values of the irradiance integrated over increasing areas are used to enhance the contributions of small irradiances at large scattering angles and to reduce the coherent noise. In the case of self-similar surfaces, the scaling behavior of IWT allows investigation of the surface roughness at various length scales. For the realistic case of self-affine surfaces, IWT permits the evaluation of the scaling exponent of the autocorrelation and also offers a direct way to evaluate the necessary length scale of the surface profile. |
| Keywords: | Integrated wavelet transform rough surface fractal surface self-similar surface self-affine surface autocorrelation scaling exponent |
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