| 一种基于环振的SRAM型FPGA延迟测试方法 |
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| 引用本文： | 杨金孝,郭德春,陈雷,张永波,杨永坤.一种基于环振的SRAM型FPGA延迟测试方法[J].微电子学,2011,41(3). |
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| 作者姓名： | 杨金孝 郭德春 陈雷 张永波 杨永坤 |
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| 作者单位： | 1. 西北工业大学,西安,710129
2. 北京微电子技术研究所,北京,100076 |
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| 摘 要： | 提出一种使用环形振荡器对SRAM型FPGA内部延迟进行精确测试的方法。该方法利用SRAM型FPGA的可重构性在其内部构造环形振荡器,通过基准信号对分频后的振荡信号周期进行测量,从而得到环振回路中逻辑部件的延迟值。应用该方法,对一款Virtex-4型FPGA的内部延迟进行测试。结果表明:在环振初始振荡频率小于芯片工作极限频率的情况下,延迟测试的误差小于1 ps,与其他检测FPGA内部延迟故障的方法相比,检测精度有很大的提高,同时,该方法对SRAM型FPGA具有较高的普遍适用性。
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| 关 键 词： | 环形振荡器 FPGA 延迟 测试 |
A Novel Test Method for Delay in SRAM FPGA Based on Ring Oscillator |
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| YANG Jinxiao,GUO Dechun,CHEN Lei,ZHANG Yongbo,YANG Yongkun.A Novel Test Method for Delay in SRAM FPGA Based on Ring Oscillator[J].Microelectronics,2011,41(3). |
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| Authors: | YANG Jinxiao GUO Dechun CHEN Lei ZHANG Yongbo YANG Yongkun |
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| Institution: | YANG Jinxiao1,GUO Dechun1,CHEN Lei2,ZHANG Yongbo1,YANG Yongkun1(1.Northwestern Polytechnical University,Xi'an 710129,P.R.China,2.Beijing Microelectronics Technology Institution,Beijing 100076,P.R.China) |
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| Abstract: | A novel test method for delay in SRAM FPGA based on ring oscillator was presented.A ring oscillator was configured in the targeted FPGA,and the oscillating signal was divided and the signal cycle was measured by standard clock,so that the delay of the logic block and interconnect located in the ring oscillator could be measured with high resolution.The strategy was implemented on a Virtex-4 FPGA.Experimental results showed that,when initial oscillating frequency of the ring oscillator was below the extreme ... |
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| Keywords: | Ring oscillator FPGA Delay Test |
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