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Electronic properties of clean and oxygen exposed GaAs (100) surfaces
Institution:1. Central European Institute of Technology, Brno University of Technology, Purkynova 123, Brno 61200, Czech Republic;2. Center of Materials and Nanotechnologies, Faculty of Chemical Technology, University of Pardubice, Nam. Cs. Legii 565, Pardubice 53002, Czech Republic
Abstract:Both Photoemission Yield Spectroscopy (PYS) and Auger Electron Spectroscopy (AES) have been used in the study of the electronic properties of the clean GaAs(100) surface prepared by IBA procedure and subsequently exposed to oxygen. For the clean GaAs(100)c(8 × 2) surface, the values of the work function and the absolute band bending were 4.20 ± 0.02 eV and −0.23 ± 0.06 eV, respectively, which confirms the pinning of the Fermi level EF, and two filled electronic surface state bands localized in the band gap below the Fermi level were observed. After exposition of this surface to 103 L of oxygen, the electronic surface state band localized just below the Fermi level EF disappeared, and the work function and the absolute band bending increased by only 0.12eV, whereas for the higher oxygen exposures of 104L and 105L, only small increases in the values of the work function and the absolute bending by 0.04 eV and 0.03 eV, respectively, were observed.
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