Tunable intensity of the spectral reflectance of a guided-mode resonance filter with dual channels |
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| Authors: | Qi Wang Dawei Zhang Yuanshen Huang Zhengji Ni Songlin Zhuang |
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| Affiliation: | Shanghai Key Laboratory of Modern Optics System, School of Optics-Electrical and Computer Engineering, University of Shanghai for Science and technology, 516 Jungong Rd, 200093 Shanghai, China |
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| Abstract: | Simulating the characteristics of a guided-mode resonance filter with rigorous coupled wave analysis, we find that, by adjusting the azimuthal angle of the grating used as a sub-layer of the guided-mode resonance filter from 0° to 90° under TE-reflectance, the intensity of the spectral reflectance of the guided-mode resonance filter monotonically increases at the wavelength of 684.6 nm, while the spectral reflectance monotonically decreases at the wavelength of 723 nm. Moreover, the spectral reflectance with TE-reflectance at 90° corresponds to the TM-reflectance at 0°. The phenomenon means that the intensity of the spectral reflectance can be easily tuned with different azimuthal angles by choosing appropriate structure parameters of the guided-mode resonance filter. |
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| Keywords: | Diffraction and gratings Subwavelength structures Wavelength filtering devices |
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