| Abstract: | Thin layers of (25–1000 Å) tin were evaporated onto a highly oriented polypropylene sheet. Two rates of deposition were used: 5 and 20 Å/s. For the more rapid deposition rate, a preferred orientation of tin was found in all cases. Here, the Sn a axis lay parallel to the polymer chain (polymer c axis). The same orientation relationship was found for the slower deposition rate, but only at lower Sn film thicknesses; at the higher film thicknesses, a random orientation of crystallites is found. Scanning electron micrographs show an equiaxed tin grain structure for the case of no preferred orientation and a platelet morphology for the case of preferred orientation, the thin dimension of the platelets lying perpendicular to the polymer chain axis. Although no clearcut evidence either for or against crystallographic epitaxy has been found, a plausible case for geometrical epitaxy is presented. |
