Research Center for Quantum Effect Electronics, Tokyo Institute of Technology, 2-12-1 O-okayama, Meguro-ku, Tokyo 152-8552, Japan
Abstract:
Visible photoluminescence (PL) of nanocrystalline silicon (nc-Si) embedded in single crystal CaF2 formed on Si(1 1 1) has been studied and the influence of ex situ rapid thermal annealing (RTA) on the surface morphology and PL spectra has been studied. It has been found that the PL intensity and uniformity was improved by RTA with appropriate temperature and short annealing time.