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Light emission from Si nanocrystals embedded in CaF2 epilayers on Si(1 1 1): Effect of rapid thermal annealing
Authors:Masahiro Watanabe   Takeo Maruyama  Soichiro Ikeda
Affiliation:

Research Center for Quantum Effect Electronics, Tokyo Institute of Technology, 2-12-1 O-okayama, Meguro-ku, Tokyo 152-8552, Japan

Abstract:Visible photoluminescence (PL) of nanocrystalline silicon (nc-Si) embedded in single crystal CaF2 formed on Si(1 1 1) has been studied and the influence of ex situ rapid thermal annealing (RTA) on the surface morphology and PL spectra has been studied. It has been found that the PL intensity and uniformity was improved by RTA with appropriate temperature and short annealing time.
Keywords:Nanocrystalline silicon   Epitaxial   CaF2   Photoluminescence   Rapid thermal annealing   Co-evaporation
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