Calibration of Micromatter Co. standards used for the calibration of PIXE analysis systems |
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| Authors: | D. W. Mingay |
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| Affiliation: | 1. Physics Division, Atomic Energy Board, Private Bag X256, Pretoria, (South Africa)
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| Abstract: | The evaluation of the accuracy of thin elemental standards produced by Micromatter Co., which are widely used for the calibration of the detection sensitivity of PIXE analysis systems, is presented in terms of Rutherford scattering measurements of the thickness of 68 standards covering a range of 59 different elements. |
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