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Fictive temperature of GeO2 glass: Its determination by IR method and its effects on density and refractive index
Institution:Department of Materials Science and Engineering, Rensselaer Polytechnic Institute, Troy, NY 12180-3593, USA
Abstract:A simple IR method of determining the fictive temperature of GeO2 glass, both surface and bulk, was developed using the same technique developed earlier for silica glass. Specifically, IR absorption and reflection peak wavenumbers of GeO2 structural bands were found to be correlated with the fictive temperature of the glass. Using this method structural relaxation kinetics can be investigated. Density and refractive index of GeO2 glass were also measured as a function of fictive temperature.
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