EXAFS investigation on the structural environment of Tm3+ in Ge–Ga–S–CsBr glasses |
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| Institution: | 1. Center for Information Materials and Department of Materials Science and Engineering, Pohang University of Science and Technology, Pohang, Gyeongbuk 790-784, Republic of Korea;2. Department of Materials Science and Engineering, Hankuk Aviation University, Goyang, Gyeonggi 412-791, Republic of Korea;3. National Institute of Advanced Industrial Science and Technology (AIST), Midorigaoka, Ikeda, Osaka 563-8577, Japan;1. Department of Physics, Indian Institute of Science, Bangalore, India;2. Department of Material Science and Engineering, Lehigh University, Bethlehem, PA, USA;3. Alfred University, New York State College of Ceramics, Alfred, NY, USA;4. Corning Incorporated, Corning, NY, USA;5. Department of Instrumentation, Indian Institute of Science, Bangalore, India;6. Materials Research Centre, Indian Institute of Science, Bangalore, India |
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| Abstract: | The local structures around Tm3+ in Ge0.25Ga0.10S0.65 and 0.90 (Ge0.25Ga0.10S0.65) − 0.10CsBr glasses were investigated using Extended X-ray absorption fine structure (EXAFS) spectroscopy. In Ge0.25Ga0.10S0.65 glass, Tm3+ ions are surrounded by approximately seven S ions. Addition of 10 mol% CsBr resulted in significant changes in the EXAFS spectrum of Tm3+ ions due to the changes in the local structure surrounding Tm3+ ions. The first-nearest coordination shell around Tm3+ ion is predominantly composed of about six Br ions in 0.90 (Ge0.25Ga0.10S0.65) − 0.10CsBr glass. |
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