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基于AT89C51的数字集成电路测试仪的设计
引用本文:闫露露,王容石子,尹继武.基于AT89C51的数字集成电路测试仪的设计[J].电子质量,2010(8):7-9.
作者姓名:闫露露  王容石子  尹继武
作者单位:陕西理工学院电信工程系,陕西,汉中,723003
摘    要:以单片机AT89C51为核心,通过串口与下位机通信,设计了一种通过电脑操作,单片机控制的数字集成芯片测试仪,该系统能对常用的20种74系列数字集成电路作出准确快速的功能检查。系统主要由控制及测试、上位机通信两部分组成。控制及测试部分以单片机AT89C51为核心组成,上位机通信部分由Vb编写的可视化用户界面和电平转换电路MAX232组成。

关 键 词:集成电路  测试  上位机  串口通信

Design of The Testing Instrument for Digital IC Based on AT89C51 Microcontroller
Yan Lu-lu,Wang Rong-shi-zi,Yin Ji-wu.Design of The Testing Instrument for Digital IC Based on AT89C51 Microcontroller[J].Electronics Quality,2010(8):7-9.
Authors:Yan Lu-lu  Wang Rong-shi-zi  Yin Ji-wu
Institution:(Department of Electronic and Information Engineering,Shanxi University of Technology,Shanxi Hanzhong 723003)
Abstract:This paper based on microcontroller AT89C51,communication with lower computer through the serial ports,designed a testing instrument for digital IC by computer-operated,which controlled by microcontroller.The system can make function tests accurately and fastly in 20 kinds of 74 series digital IC frequently-used.It made up of control and test circuit and upper computer communication circuit.Control and test circuit contains microcontroller AT89C51,upper computer communication circuit includes visual user interface compiled by Visual Basic and level converter circuit MAX232.
Keywords:IC  Test  Upper Computer  Serial Communication
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