Self-consistent model for ultrafast near-field microscopy and near-field luminescence microscopy modeling of semiconductor surface期刊界 All Journals 搜尽天下杂志传播学术成果专业期刊搜索期刊信息化学术搜索

Self-consistent model for ultrafast near-field microscopy and near-field luminescence microscopy modeling of semiconductor surface

Authors:	V.Z. Lozovski

Affiliation:	Department of Semiconductor Electronics, Kyiv National Taras Shevchenko University, Glushkov Avenue, 2 Building 5, Kyiv-22, 03022, Ukraine

Abstract:

Keywords:	42.65.An 68.37.Uv 73.21.La
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