Simple optoelectronic method for analysis of transverse mode structure of lasers |
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Authors: | Renaud de Saint Denis |
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Institution: | Centre de recherche sur les Ions, les Matériaux et la Photonique (CIMAP), UMR6252 CEA-CNRS-ENSICAEN et Université de Caen, ENSICAEN, 6 Bd. Maréchal Juin, F14050 Caen, France |
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Abstract: | Laser beam quality evaluation is generally carried out through the measurement of the M2 second-moment. This standard procedure is time consuming and is difficult to be implemented for checking, for instance, each VCSEL diode moving out of the assembly line of a high volume production factory. In this paper, we propose an alternative fast method allowing to distinguish easily a single transverse mode from a multiple transverse mode behaviour. This method is based on an electronic analysis (locking amplifier) of the local slope of the output laser characteristic, i.e. laser output power versus pumping. |
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