One-shot birefringence dispersion measurement based on channeled spectrum technique |
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Authors: | Toshitaka Wakayama Yukitoshi Otani Norihiro Umeda |
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Affiliation: | Department of Mechanical Systems of Engineering, Tokyo University of Agriculture and Technology, Nakacho 2-24-16, Koganei, Tokyo, Japan |
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Abstract: | A one-shot method for measuring birefringence dispersion has been proposed that utilizes two retarders having different high-order birefringences. The intensity distribution of a channeled spectrum changes with different frequencies as a function of wavenumber. An intensity distribution is sufficient to determine the birefringence dispersion using the amplitude and phase components obtained by applying the fast Fourier transform. Experimental results demonstrate that this technique can measure the wavelength dependences of both the azimuthal angle and the retardation. |
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Keywords: | Birefringence measurement Channeled spectrum Mueller matrix |
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