相对标定电荷交换复合谱及束发射谱测量杂质浓度的方法研究

采用数值模拟方法计算了HL-2A装置上电荷交换复合谱和束发射谱的强度,并根据两种光谱的比值得到碳和氦杂质的浓度,与初始假设对比后验证了该方法理论上的可靠性。实验上采用一台三光栅光谱仪系统,利用同一视线、同时测量了碳(CⅥ)、氦(HeⅡ)的电荷交换复合谱及中性束发射谱,首次在HL-2A装置上同步获得了C6+、He2+离子的绝对浓度剖面。该方法采用了相对强度标定而非复杂的绝对强度标定,并且避免了中性束衰减计算。

Measurement of impurity concentration by relative calibration of the charge exchange recombination spectra and beam emission spectra

Intensity of the charge exchange recombination spectrum and the beam emission spectrum on the HL-2A tokamak were obtained by numerical simulation method, and the plasma impurity concentrations were obtained by the ratio of these two spectra. The simulation was to validate the possibility and reliability of the method. A three-grating spectrometer system was used in the experiment. Using the same line of sights, simultaneous measurement of carbon (C VI), helium (He II) charge exchange recombination spectrum and neutral beam emission spectrum were obtained for the first time on HL-2A. Absolute concentration profile of C6+ and He2+ ions were obtained synchronously on HL-2A for the first time. The method uses relative intensity calibration instead of complex absolute intensity calibration and avoids neutral beam attenuation calculations.