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基于PXI和GPIB总线电路测试系统的开发与设计
引用本文:李亦君.基于PXI和GPIB总线电路测试系统的开发与设计[J].现代电子技术,2010,33(22):35-37.
作者姓名:李亦君
作者单位:中国空空导弹研究院,河南洛阳471009
摘    要:传统的人工方法检测硬件电路的性能存在一系列的问题。测试总线技术是支撑自动化测试系统发展的核心技术,该项目借鉴国内外在自动测试系统(ATS)尤其是军用ATS中的先进技术,针对该电路性能检测的需要,提出基于PXI和GPIB总线的 LabVIEW软件平台自动测试系统设计方法。对提高电路测试效率、可信度和自动化水平具有重要意义,解决了工程应用的实际问题,是一项成功的ATS应用案例。

关 键 词:GPIB  PXI总线  仪器总线  自动测试

Design of Circuit Test System Based on PXI and GPIB
LI Yi-jun.Design of Circuit Test System Based on PXI and GPIB[J].Modern Electronic Technique,2010,33(22):35-37.
Authors:LI Yi-jun
Institution:LI Yi-jun (China Airborne Missile Academy, Luoyang 471009, China )
Abstract:A series of problems exist in the traditional manual methods for testing the performance of circuit. The test bus technology is the core of development of automatic test system (ATS). With various advanced techniques on ATS at home and abroad absorbed, especially on military ATS, a new automatic testing system based on the GPIB and PXI bus is designed by using Labview. The design not only significantly improves the efficiency, reliability and automatic level of circuit testing, but also solves the practical problems in engineering. It is a successfully applied case of ATS.
Keywords:GPIB  PXI bus  instrumental bus  automatic testing
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