X-ray diffraction line profile from the aggregate of distorted crystallites. II

An expression for the fourth moment of the line profile in terms of several strain derivatives and the possibility of measuring the ‘wavelength’ of crystal distortions (λ) for any sinusoidally varying component of the strain are available. The experimental means for evaluating such strain derivatives in the expression for the fourth moment was earlier described. A numerical method for evaluating this wavelength and its subsequent use to determineλ in several samples ofα-brass is presented here. The data used are taken from the earlier paper of the authors. An attempt has been made to interpret the values ofλ and their changes with cold working and annealing in terms of lattice strain.