Differential method for observing defects with the use of a combined polarized radiation |
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| Authors: | V S Chudakov |
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| Institution: | (1) Shubnikov Institute of Crystallography, Russian Academy of Sciences, Leninskii pr. 59, Moscow, 117333, Russia |
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| Abstract: | The conditions for observing crystal defects by a new differential method based on the use of combined radiation with two equally intense orthogonally polarized components have been considered. The conditions for recording three groups of defects possessing different optical properties (absorption, scattering, polarizability, and refraction) are indicated. The new method is implemented on the basis of a scanning image converter widely used in optical flaw detection of crystals. |
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