Raman study of the structure of glasses along the join SiO2GeO2 |
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Authors: | Shiv K Sharma Dean W Matson John A Philpotts Ted L Roush |
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Affiliation: | Hawaii Institute of Geophysics, University of Hawaii, 2525 Correa Road, Honolulu, Hawaii 96822, USA |
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Abstract: | In order to better understand the distribution of tetrahedra in multicomponent tetrahedral network structures of melts and glasses, we have investigated the Raman spectra of binary SiO2GeO2 glasses. We compare the Raman spectral features of the end-member glasses and discuss their vibrational origins. The mixing of GeO2 and SiO2 melts results in a continuous random network structure of TO4 tetrahedra (T Si, Ge) in the glass. Raman bands corresponding to the asymmetric stretch (vas) of oxygen in GeOGe, SiOSi and SiOGe bonds are observed in the glasses having intermediate compositions along the SiO2GeO2 join. The presence of three distinct vas (TOT) bands in the spectrum of a glass having Si/Ge one reveals that a considerable degree of SiGe disorder exists in the glass. The presence of a single symmetric oxygen stretching band in the spectra of binary SiO2GeO2 glasses indicates that the symmetric stretch modes (vs) of oxygen in SiOSi, SiOGe and GeOGe bonds are strongly coupled. An observed decrease in the halfwidth of the vs (TOT) band in the spectra of SiO2GeO2 glasses with increasing concentration of GeO2 may be attributed to a decrease in the average TOT bond angle and a predominance of six-membered ring structures. Results of the present study support the assignment of the bands in the 900–1200 cm?1 region of the alumino-silicate glasses, spectra to the vas(AlOSi) and vas(SiOSi) modes. In contrast to the alumino-silicate glasses, however, the SiO2GeO2 glasses have a much higher degree of disorder of the network-forming cations. |
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