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Crystallization and properties of CrSi2 single crystals grown from a tin solution-melt |
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| Authors: | F Yu Solomkin V K Zaitsev N F Kartenko A S Kolosova A S Orekhov A Yu Samunin and G N Isachenko |
| Institution: | (1) Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 1-1, Katahira, 2 Chome, Aobaku, 980-8577 Sendai, Japan;(2) Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, 1-1, Katahira, 2 Chome, Aobaku, 980-8577 Sendai, Japan |
| Abstract: | Using the solution-melt method combined with the Bridgman method, CrSi2 single-crystal needles and single-crystal tubes are grown at a temperature lower than their melting (crystallization) temperature. Microcrystals thus grown feature an anomalously high thermal emf. The growth of CrSi2 single-crystal tubes is an important step forward in the production of various devices based on high-temperature thermoelectric materials. |
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