| 平面汞膜电极二阶倒导数电位溶出分析法研究 |
| |
| 引用本文： | 阮湘元,赵鸿斌.平面汞膜电极二阶倒导数电位溶出分析法研究[J].分析化学,1995,23(11):1261-1266. |
| |
| 作者姓名： | 阮湘元 赵鸿斌 |
| |
| 作者单位： | 东莞理工学院化学系，东莞理工学院化学系，湘潭大学化学系，湘潭大学化学系，暨南大学化学系 东莞511700，东莞511700，物理系，湘潭411105，物理系，湘潭411105，广州510632 |
| |
| 摘 要： | 对电位溶出的Ｅ－ｔ曲线进行二阶倒导数处理，提高了二阶倒导数电位溶出分析法理论，其信号较一阶倒导数法增强约４３．１ｎ倍，分辨率由原来的６５．５ｍＶ／ｎ改善到４８．２ｍＶ／ｎ。用根据二阶倒导数法原理自行设计研制的多阶倒导数电位出仪验证了本提出了的理论，富集１２０ｓ，Ｃｄ＾２＋的检测限可达１．０×１０＾－１０ｍｏｌ／Ｌ。
|
| 关 键 词： | 电位溶出分析法 二阶倒导数 汞膜电极 |
Study on the Second Reciprocal Derivative Potentiometric Stripping Analysis With a Mercury Thin-film Electrode |
| |
| Ruan Xiangyuan,Su Yaling.Study on the Second Reciprocal Derivative Potentiometric Stripping Analysis With a Mercury Thin-film Electrode[J].Chinese Journal of Analytical Chemistry,1995,23(11):1261-1266. |
| |
| Authors: | Ruan Xiangyuan Su Yaling |
| |
| Abstract: | Based on the second reciprocal derivation of E-t curve in normal poPentiometric stripping analysis (PSA), a theory describing the second reciprocal derivative potentiometric stripping analysis(SRD-PSA) with a mercury thin-film electrode(MTFE) is presented. Signal in SRD-PSA is enhanced about 43n times, compared with those in the first reciprocal derivative potentiometric stripping analysis (FRD-PSA). The peak-peak width Wpp in SRD-PSA is 48. 2/n mV, showing the resolution in SRD-PSA is increased by about 25% compared the half peak width 65. 5/n mV in FRD-PSA, The theory is verified with a home-made multi-reciprocal derivative PSA/CCSA system. Experimental results are in good agreement with those of the theory. The detection for cadmium is 1. OX 10-10 mol/L under conditions of w=2800 r/min, i.= 1 uA, tp = 100 s, and 20 min of deaeration for O2 |
| |
| Keywords: | Potentiometric stripping analysis mercury thin-film electrode second reciprocal derivation |
| 本文献已被 CNKI 维普 等数据库收录！ |
