Limitations and improvements of trace element analysis with proton-induced X-rays

The technique of trace element analysis by the detection of characteristic X-rays induced by high energy proton bombardment is critically examined. A discussion of the restrictions imposed by detector resolution is made, the behavior of the cross-section for X-ray production as a function of energy and atomic number is discussed. The effect of this behavior upon analysis time is demonstrated. Background is discussed in terms of its effect on the total counting rate. The use of a silicon solid state detector to determine the overlappingK-lines of light elements andL-lines of heavy elements is shown to have severe limitations. A combination of crystal monochromators and solid state detectors is suggested as a means to circumvent some of the fundamental limitations encountered with a single detector. An experimental arrangement for the use of twenty-four crystal monochromators and two solid state detectors is shown. Work supported in part by the U.S. Atomic Energy Commission.