| Theoretical Study on the Capillary Force between an Atomic Force Microscope Tip and a Nanoparticle |
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| 引用本文： | 李朝霞 张立娟 伊厚会 方海平. Theoretical Study on the Capillary Force between an Atomic Force Microscope Tip and a Nanoparticle[J]. 中国物理快报, 2007, 24(8): 2289-2292 |
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| 作者姓名： | 李朝霞 张立娟 伊厚会 方海平 |
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| 作者单位： | [1]Shanghai Institute of Applied Physics, Chinese Academy of Sciences, PO Box 800-204, Shanghai 201800 [2]Graduate School of the Chinese Academy of Sciences, Beijing 100080 |
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| 基金项目： | Supported by Chinese Academy of Sciences, the National Science Foundation of China under Grant Nos 10474109 and 10674146, and the National Basic Research Programme of China under Grant No 2006CB708612. The authors thank Dr Wan Rong-Zheng, Lu Hang- Jun, Wang Hua-Bin, and Wang Peng and Wang Ying, Mi Li-Juan for their helpful discussions and suggestions |
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| 摘 要： | Considering that capillary force is one of the most important forces between nanoparticles and atomic force microscope （AFM） tips in ambient atmosphere, we develop an analytic approach on the capillary force between an AFM tip and a nanoparticle. The results show that the capillary forces are considerably affected by the geometry of the AFM tip, the humidity of the environment, the vertical distance between the AFM tip and the nanoparticle, as well as the contact angles of the meniscus with an AFM tip and a nanoparticle. It is found that the sharper the AFM tip, the smaller the capillary force. The analyses and results are expected to be helpful for the quantitative imaging and manipulating of nanoparticles by AFMs.
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| 关 键 词： | 毛管力 原子力 显微镜镜片 毫微粒 |
| 收稿时间： | 2007-01-28 |
| 修稿时间： | 2007-01-28 |
Theoretical Study on the Capillary Force between an Atomic Force Microscope Tip and a Nanoparticle |
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| LI Zhao-Xia,ZHANG Li-Juan,YI Hou-Hui,FANG Hai-Ping. Theoretical Study on the Capillary Force between an Atomic Force Microscope Tip and a Nanoparticle[J]. Chinese Physics Letters, 2007, 24(8): 2289-2292 |
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| Authors: | LI Zhao-Xia ZHANG Li-Juan YI Hou-Hui FANG Hai-Ping |
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| Affiliation: | 1 Shanghai Institute of Applied Physics, Chinese Academy of Sciences, PO Box 800-204, Shanghai 201800; 2 Graduate School of the Chinese Academy of Sciences, Beijing 100080 |
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| Abstract: | Considering that capillary force is one of the most important forces between nanoparticles and atomic force microscope (AFM) tips in ambient atmosphere, we develop an analytic approach on the capillary force between an AFM tip and a nanoparticle. The results show that the capillary forces are considerably affected by the geometry of the AFM tip, the humidity of the environment, the vertical distance between the AFM tip and the nanoparticle, as well as the contact angles of the meniscus with an AFM tip and a nanoparticle. It is found that the sharper the AFM tip, the smaller the capillary force. The analyses andresults are expected to be helpful for the quantitative imaging and manipulating of nanoparticles by AFMs. |
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| Keywords: | 47.55.Dr 68.08.-p 68.03.Cd |
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