Metal oxide semiconductors based on tin dioxide: Gas-sensitivity to methane in a wide range of temperatures,concentrations and humidities of the gas phase |
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Authors: | V V Malyshev A V Pislyakov |
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Institution: | (1) Institute of Molecular Physics, Kurchatov Institute Russian Research Center, pl. Kurchatova 1, Moscow, 123182, Russia |
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Abstract: | The response of metal oxide semiconductors (MOSs) made by the thick-film technology on the basis of SnO2 with various catalytic additives was studied in dry gaseous media containing 200 ppm CH4 in the temperature range 100–600° C. Concentration dependence was studied for four sensors (on the basis of pure SnO2 and with three catalytic additives, 3% Pd, 1% Sb2O5 + 3% La2O3, and 1% Pt + 3% Pd) in the concentration range 1–20600 ppm CH4 at the humidity of the gas phase varied from 0 to 100%. It was found out that, in the strength of all performance and technical characteristics, the structure SnO2 + 1% Pt + 3% Pd working at 400°C and consuming ~180 mW was the best for recording CH4. |
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