The system of double-optical-path ESPI for the vibration measurement |
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| Authors: | Jia Shuhai Yue Kaiduan Tan Yushan |
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| Institution: | a Research Institute of Micro Nanometer Technology, Shanghai Jiaotong University, Shanghai 200030, People's Republic of China;b School of Mechanical Engineering, Laser & IR Institute, Xi’an Jiaotong University, Xi’an, Shaanxi, 710049, People's Republic of China |
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| Abstract: | In this paper, a system of double-optical-path electronic speckle pattern interferometry (ESPI) for measuring larger vibration is proposed. This system combines the conventional ESPI optical path for measuring out-of plane vibration and the de-sensitized optical path. It can be used to observe qualitatively and analyze quantitatively the vibration mode. At the same time, the phase unwrapping is avoided. The anti-disturbance capability of this system is high, so it can be used to analyze the vibration characteristics of complex and discontinuous structure in actual engineering. |
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| Keywords: | Electronic speckle pattern interferometry (ESPI) Phase-shifting larger vibration measurement |
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