The structure of copper-doped amorphous hydrogenated carbon films |
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Authors: | T N Vasilevskaya N S Andreev I A Drozdova V N Filipovich S G Yastrebov T K Zvonareva |
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Institution: | (1) I. V. Grebenshchikov Institute of Silicate Chemistry, Russian Academy of Sciences, 199155 St. Petersburg, Russia;(2) A. F. Ioffe Physicotechnical Institute, Russian Academy of Sciences, 194021 St. Petersburg, Russia |
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Abstract: | A study of the nanostructure of a-C:H:Cu films by x-ray small-angle scattering, x-ray diffraction, TEM, and visible and UV spectroscopy is reported. It has
been established that introduction of 9–16 at.% Cu not only decorates the original carbon fragments but produces extended
(up to 4 μm in length) formations of copper-decorated strongly elongated ellipses as well. At 14–16 at.% Cu, these linear
clusters represent copper nanotubes with a core made up of the original ellipses drawn in a line. It is these conducting copper
formations that account primarily for the strong increase in conductivity at 12–16 at.% Cu contents in a-C:H films.
Fiz. Tverd. Tela (St. Petersburg) 41, 2088–2096 (November 1999) |
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