Structural,dielectric and ac conductivity properties of Ni-doped HoFeO3 before and after gamma irradiation

A series of samples of HoFe_1?x Ni _x O₃ (x = 0.0, 0.1, 0.3) were prepared using the solid-state reaction technique to understand the structural, dielectric and conductivity properties before and after gamma irradiation of accumulated dose of 625 KGy. The X-ray diffraction confirms that all the samples exist in single-phase orthorhombic structure having space group Pbnm. With increasing dopant Ni, the unit cell volume and lattice parameters undergo small change. X-ray analysis show change in the interplanar spacing and full width at half maximum values after gamma irradiation. The Raman spectra of the samples show modifications after gamma irradiation. It can be easily seen that after gamma irradiation intensity, peak width are completely altered by gamma-absorbed dose. Measurement of dielectric loss and dielectric constant at room temperature was performed before and after gamma irradiation in the frequency range of 20 Hz–1 MHz. It is observed that the value of dielectric constant decreases after irradiation. The ac conductivity is estimated from the dielectric constant and loss tangent. Exposure to gamma radiation results in substantial modification in the physical properties of the Ni-doped Ho-based orthoferrites.