一种用于MEMS电容式加速度计的116dB动态范围CMOS读出电路

A high stability in-circuit reprogrammable technique control system for a capacitive MEMS accelerometer is presented. Modulation and demodulation are used to separate the signal from the low frequency noise. A low-noise low-offset charge integrator is employed in this circuit to implement a capacitance-to-voltage converter and minimize the noise and offset. The application-specific integrated circuit （ASIC） is fabricated in a 0.5 /μm one-ploy three-metal CMOS process. The measured results of the proposed circuit show that the noise floor of the ASIC is -116 dBV, the sensitivity of the accelerometer is 66 mV/g with a nonlinearity of 0.5%. The chip occupies 3.5×2.5 mm2 and the current is 3.5 mA.

116 dB dynamic range CMOS readout circuit for MEMS capacitive accelerometer

in-circuit reprogrammable technique MEMS accelerometer modulation and demodulation sensitiv-ity of accelerometer