Secondary ion emission from clean and K-covered Ni surfaces near threshold impact energies |
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Authors: | C Kim JR Han H Kang |
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Institution: | Department of Chemistry, Pohang University of Science and Technology, Pohang 790-784, South Korea |
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Abstract: | Clean and K-covered Ni surfaces are bombarded with low energy (10–500 eV) beams of He+, Ne+, Ar2+, and Kr+ ions, and the emitted ion yield is measured as a function of beam energy. The apparent threshold energies for K+ and Ni+ emission are proportional to the ionic binding energies of K+ and Ni+ to the Ni surface. From comparison of the ion and neutral yield curves, it is suggested that these ions are emitted via momentum transfer collisions similar to neutral sputtering. |
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