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The use of 2D diffractometry data for oriented samples in the choice of a unit cell
Authors:A.?S.?Sukhikh  author-information"  >  author-information__contact u-icon-before"  >  mailto:a_sukhikh@niic.nsc.ru"   title="  a_sukhikh@niic.nsc.ru"   itemprop="  email"   data-track="  click"   data-track-action="  Email author"   data-track-label="  "  >Email author,T.?V.?Basova,S.?A.?Gromilov
Affiliation:1.Nikolaev Institute of Inorganic Chemistry, Siberian Branch,Russian Academy of Sciences,Novosibirsk,Russia;2.Novosibirsk National Research State University,Novosibirsk,Russia
Abstract:An approach for the substantiated choice of the indexing procedure of a diffraction pattern is described. The technique is based on a combined use of powder X-ray diffraction data in Bragg–Brentano schemes and 2D GIXD of mainly oriented polycrystalline samples.
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