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Neutron Reflectometry Studies of ZnO Films |
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| Authors: | V?D?Zhaketov E?Chitanu |
| Institution: | 1.Joint Institute for Nuclear Research,Dubna, Moscow oblast,Russia;2.National Institute for Electrical Engineering ICPE-CA,Bucharest,Romania |
| Abstract: | Textured Al-doped ZnO films are studied using neutron reflectometry. The films are quasiperiodic structures with a period of several nanometers. The films are inhomogeneous in a surface layer with a thickness of 10–20 nm. |
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