Transport parameters of granular La0.67Ca0.33MnO3 films grown on an R-plane sapphire

Precisely (100)-oriented, 200-nm thick La_0.67Ca_0.33MnO₃ films have been grown by laser ablation on a sapphire (R-plane) substrate covered by a (100)SrTiO₃/(001)Bi₂SrNb₂O₉/(001)CeO₂ trilayer buffer. The azimuthal misorientation of crystal grains (50–300 nm) in the La_0.67Ca_0.33MnO₃ films decreased by about 40% as the condensation temperature was increased ered from 760 to 810° C. The lattice parameter of the grown manganate films was reduced to 3.81–3.82 Å by enriching them with oxygen. The maximum in the temperature dependence of the electrical resistivity of the La_0.67Ca_0.33MnO₃ films grown was shifted toward lower temperatures by 20–50 K relative to its position for bulk ceramic samples of a stoichiometric composition. The largest magnetoresistance (MR=42% at H=0.4 T) was found in La_0.67Ca_0.33MnO₃ films with a Mn⁴⁺ concentration on the order of 50% (T=166 K).