Characterization of pure and copper-doped iron tartrate crystals grown in silica gel |
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Authors: | V MATHIVANAN M HARIS |
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Institution: | 1. Department of Physics, Karunya University, Karunya Nagar, Coimbatore, 641 114, India 2. Department of Physics, United Institute of Technology, Coimbatore, 641 020, India
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Abstract: | Single crystal growth of pure and copper-doped iron tartrate crystals bearing composition Cu x Fe(1???x)C4H4O6·nH2O, where x = 0, 0.07, 0.06, 0.05, 0.04, 0.03, is achieved using gel technique. The elemental analysis has been done using energy-dispersive X-ray analysis (EDAX) spectrum. The characterization studies such as Fourier transform infrared spectroscopy (FTIR), powder X-ray diffraction (XRD), magnetic analysis and thermal analysis have been done for crystals with x = 0 for pure iron tartrate and with x = 0.05 for copper-mixed iron tartrate crystals. A detailed comparison has been made between pure and doped crystals. |
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