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Crystallographic Tilt in Aluminum Gallium Nitride Epilayers Grown on Miscut Aluminum Nitride Substrates
Authors:Shashwat Rathkanthiwar  Milena B Graziano  James Tweedie  Seiji Mita  Ronny Kirste  Ramon Collazo  Zlatko Sitar
Institution:1. Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC, 27695-7919 USA;2. Adroit Materials, Inc., 2054 Kildaire Farm Road, Cary, NC, 27518 USA;3. Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC, 27695-7919 USA

Adroit Materials, Inc., 2054 Kildaire Farm Road, Cary, NC, 27518 USA

Abstract:
Keywords:AlGaN  AlN substrates  strain relaxation  tilt
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