Polarization resolved reflection from ordered vertical silicon nanowire arrays |
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| Authors: | M Khorasaninejad N Abedzadeh J Sun J N Hilfiker S S Saini |
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| Affiliation: | Department of Electrical and Computer Engineering, University of Waterloo, 200, University Avenue West, Waterloo, Ontario, Canada. |
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| Abstract: | We measure polarization resolved reflections from ordered vertical silicon nanowire arrays of two different diameters and compare the results to rigorous coupled wave analysis simulations. Ellipsometric analysis based on anisotropic effective-medium approximation is used to fit the experimental data and estimate the diameter and length of the nanowires. In addition, depolarization of light is observed for wavelengths below 400 nm. |
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