Analytical TEM investigations of high-temperature superconductors |
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Authors: | Jürgen Thomas |
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Affiliation: | (1) Institut für Festkörper- und Werkstofforschung Dresden, Postfach 270016, D-01171 Dresden, Federal Republic of Germany |
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Abstract: | Electron diffraction and energy dispersive X-ray spectroscopy as analytical transmission electron microscopic methods have been applied to Y-Ba-Cu-O superconductors. The evaluation of diffraction patterns by means of the MS-WINDOWS program ELDISCA is demonstrated. The course of X-ray linescan signals in the transition range between YBa2Cu3O7– matrix and Y2BaCuO5 inclusions is explained by calculations based on a mathematical model which is described. Errors of quantiative X-ray spectroscopic results and their reasons are shown.Dedicated to Professor Dr. rer. nat. Dr. h.c. Hubertus Nickel on the occasion of his 65th birthday |
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Keywords: | analytical TEM electron diffraction EDXS high-temperature superconductors |
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