Analytical TEM investigations of high-temperature superconductors

Electron diffraction and energy dispersive X-ray spectroscopy as analytical transmission electron microscopic methods have been applied to Y-Ba-Cu-O superconductors. The evaluation of diffraction patterns by means of the MS-WINDOWS program ELDISCA is demonstrated. The course of X-ray linescan signals in the transition range between YBa₂Cu₃O_7– matrix and Y₂BaCuO₅ inclusions is explained by calculations based on a mathematical model which is described. Errors of quantiative X-ray spectroscopic results and their reasons are shown.Dedicated to Professor Dr. rer. nat. Dr. h.c. Hubertus Nickel on the occasion of his 65th birthday