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The influence of roughness on the mechanical spectroscopy of SiO2 nanorods grown by e-beam irradiation |
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| Authors: | Jesuan Betancourt Fredy Zypman Francisco Solá Oscar Resto Luis F Fonseca |
| Institution: | 1. Department of Physics and Institute for Functional Nanomaterials, University of Puerto Rico, San Juan, PR, USA;2. Yeshiva University, New York, NY, USA;1. Tribology Research Institute, National Traction Power Laboratory, Southwest Jiaotong University, Chengdu 610031, China;2. Department of Chemical Engineering and Materials Research Institute, Pennsylvania State University, University Park, PA 16803, USA;1. Center for Electronic Materials, Korea Institute of Science and Technology (KIST), Seoul 136-791, Republic of Korea;2. Department of Material Science and Engineering, Yonsei University, Seoul 120-749, Republic of Korea;3. KU-KIST Graduate School of Converging Science and Technology, Korea University, Seoul 136-701, Republic of Korea;4. Department of Mechanical Engineering, Virginia Tech, Blacksburg VA 24061, United states;5. Sensor System Research Center, Korea Institute of Science and Technology (KIST), Seoul 136-791, Republic of Korea |
| Abstract: | An extension of Euler–Bernoulli theory based on variational methods for solving flexural vibrations of nanorods has been developed which takes into account geometrical surface roughness effects, as well as internal and external friction. We apply this method to study the vibrations of e-beam induced SiO2 nanorods in the range of 10 nm in diameter and 450 nm in length. Image detection of surface roughness was carried out with the Canny edge detection algorithm. The measured surface height–height correlation function is used to characterize the surface roughness and to test for self-affine behavior. A scheme for generating random rough surfaces representative of the measured SiO2 is described along with a statistical analysis of their effect on resonant frequencies and quality factors. |
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